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"Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation."

Tinghuan Chen et al. (2022)

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DOI: 10.1109/TCAD.2021.3107250

access: closed

type: Journal Article

metadata version: 2024-03-12

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  - https://dblp.org/rec/journals/tcad/ChenSZLY022
Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu:
Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 1990-2003 (2022)

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