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"Dynamic Erase Voltage and Time Scaling for Extending Lifetime of NAND ..."

Jaeyong Jeong et al. (2017)

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DOI: 10.1109/TC.2016.2615038

access: closed

type: Journal Article

metadata version: 2023-02-07

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  persistent URL:
  - https://dblp.org/rec/journals/tc/JeongSHLK17
Jaeyong Jeong, Youngsun Song, Sangwook Shane Hahn, Sungjin Lee, Jihong Kim:
Dynamic Erase Voltage and Time Scaling for Extending Lifetime of NAND Flash-Based SSDs. IEEE Trans. Computers 66(4): 616-630 (2017)

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