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"Quantifying Electrode Reliability During Brain-Computer Interface Operation."

Hesam Sagha et al. (2015)

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DOI: 10.1109/TBME.2014.2366554

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - journals/tbe/SaghaPMC15
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  - https://dblp.org/rec/journals/tbe/SaghaPMC15
Hesam Sagha, Serafeim Perdikis, José del R. Millán, Ricardo Chavarriaga:
Quantifying Electrode Reliability During Brain-Computer Interface Operation. IEEE Trans. Biomed. Eng. 62(3): 858-864 (2015)

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