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"Joint Feature and Label Adversarial Network for Wafer Map Defect Recognition."

Jianbo Yu, Zongli Shen, Xiaoyun Zheng (2021)

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DOI: 10.1109/TASE.2020.3003124

access: closed

type: Journal Article

metadata version: 2024-02-05

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  - https://dblp.org/rec/journals/tase/YuSZ21
Jianbo Yu, Zongli Shen, Xiaoyun Zheng:
Joint Feature and Label Adversarial Network for Wafer Map Defect Recognition. IEEE Trans Autom. Sci. Eng. 18(3): 1341-1353 (2021)

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