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"A Survey of Testing Techniques for Approximate Integrated Circuits."

Marcello Traiola et al. (2020)

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DOI: 10.1109/JPROC.2020.2999613

access: closed

type: Journal Article

metadata version: 2020-12-01

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  - https://dblp.org/rec/journals/pieee/TraiolaVGBB20
Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi, Alberto Bosio:
A Survey of Testing Techniques for Approximate Integrated Circuits. Proc. IEEE 108(12): 2178-2194 (2020)

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