Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Device scaling limits of Si MOSFETs and their application dependencies."

David J. Frank et al. (2001)

> Home

Details and statistics

DOI: 10.1109/5.915374

access: closed

type: Journal Article

metadata version: 2021-08-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/pieee/FrankDNSTW01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/pieee/FrankDNSTW01
David J. Frank, Robert H. Dennard, Edward J. Nowak, Paul M. Solomon, Yuan Taur, Hon-Sum Philip Wong:
Device scaling limits of Si MOSFETs and their application dependencies. Proc. IEEE 89(3): 259-288 (2001)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.