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"Design considerations and strategies for high-reliable STT-MRAM."

Weisheng Zhao et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.001

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mr/ZhaoDLKCM11
Weisheng Zhao, Thibaut Devolder, Yahya Lakys, Jacques-Olivier Klein, Claude Chappert, Pascale Mazoyer:
Design considerations and strategies for high-reliable STT-MRAM. Microelectron. Reliab. 51(9-11): 1454-1458 (2011)

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