"On the influence of the variation of measurement conditions on the FNT ..."

Jan-Werner Zahlmann-Nowitzki, Lars Nebrich, Peter Seegebrecht (2001)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(01)00074-9

access: closed

type: Journal Article

metadata version: 2023-11-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/Zahlmann-NowitzkiNS01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/Zahlmann-NowitzkiNS01
Jan-Werner Zahlmann-Nowitzki, Lars Nebrich, Peter Seegebrecht:
On the influence of the variation of measurement conditions on the FNT characteristics of stressed thin silicon oxides. Microelectron. Reliab. 41(7): 1067-1069 (2001)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.