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Jan-Werner Zahlmann-Nowitzki

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2000 – 2009

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2001
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Jan-Werner Zahlmann-Nowitzki:
Ein Beitrag zur Zuverlässigkeit von EEPROM-Zellen für den erweiterten Betriebstemperaturbereich. University of Kiel, Germany, Mainz 2001, ISBN 978-3-86073-794-1, pp. 1-182
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Jan-Werner Zahlmann-Nowitzki, Lars Nebrich, Peter Seegebrecht:
On the influence of the variation of measurement conditions on the FNT characteristics of stressed thin silicon oxides. Microelectron. Reliab. 41(7): 1067-1069 (2001)

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