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"On the reliability of electrostatic NEMS/MEMS devices: Review of present ..."
Usama Zaghloul et al. (2011)
- Usama Zaghloul, George J. Papaioannou
, Bharat Bhushan
, Fabio Coccetti, Patrick Pons
, Robert Plana:
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. Microelectron. Reliab. 51(9-11): 1810-1818 (2011)
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