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"Conditional time resolved photoemission for debugging ICs with ..."

Frank Zachariasse, Jan van Hassel (2008)

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DOI: 10.1016/J.MICROREL.2008.06.034

access: closed

type: Journal Article

metadata version: 2020-02-22

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Frank Zachariasse, Jan van Hassel:
Conditional time resolved photoemission for debugging ICs with intermittent faults. Microelectron. Reliab. 48(8-9): 1289-1294 (2008)

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