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"Impact of strain on hot electron reliability of dual-band power amplifier ..."

Jiann-Shiun Yuan et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.02.019

access: closed

type: Journal Article

metadata version: 2021-12-10

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Jiann-Shiun Yuan, J. Ma, Wen-Kuan Yeh, Chia-Wei Hsu:
Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances. Microelectron. Reliab. 50(6): 807-812 (2010)

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