"Analysis of high power microwave induced degradation and damage effects in ..."

Xinhai Yu et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Xinhai Yu, Changchun Chai, Yang Liu, Yintang Yang, Qingyang Fan:
Analysis of high power microwave induced degradation and damage effects in AlGaAs/InGaAs pHEMTs. Microelectron. Reliab. 55(8): 1174-1179 (2015)

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