![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
"Top-down delayering to expose large inspection area on die side-edge with ..."
Huei Hao Yap et al. (2015)
- Huei Hao Yap
, Pik Kee Tan, G. R. Low, M. K. Dawood, Hua Feng, Yuzhe Zhao, Ran He, Hao Tan, J. Zhu, Binghai Liu, Y. M. Huang, D. D. Wang, Jeffrey Lam, Zhihong Mai:
Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique. Microelectron. Reliab. 55(9-10): 1611-1616 (2015)
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.