Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Detection of failure sites by focused ion beam and nano-probing in the ..."

Yu Yang et al. (2008)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2008.06.036

access: closed

type: Journal Article

metadata version: 2022-03-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/YangBASVW08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/YangBASVW08
Yu Yang, Hugo Bender, Kai Arstila, Bart Swinnen, Bert Verlinden, Ingrid De Wolf:
Detection of failure sites by focused ion beam and nano-probing in the interconnect of three-dimensional stacked circuit structures. Microelectron. Reliab. 48(8-9): 1517-1520 (2008)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.