"Elimination of stress induced dislocation in deep Poly Sinker LDMOS ..."

Xiangming Xu et al. (2015)

Details and statistics

DOI: 10.1016/J.MICROREL.2015.01.010

access: closed

type: Journal Article

metadata version: 2020-02-22

a service of  Schloss Dagstuhl - Leibniz Center for Informatics