"Devices' optimization against hot-carrier degradation in high voltage ..."

Hong Wu et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.04.009

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type: Journal Article

metadata version: 2023-06-27

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Hong Wu, Qinsong Qian, Siyang Liu, Weifeng Sun, Longxing Shi:
Devices' optimization against hot-carrier degradation in high voltage pLEDMOS transistor. Microelectron. Reliab. 50(8): 1071-1076 (2010)

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