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"Stress-induced degradation of p- and n-type organic thin-film-transistors ..."

Nicola Wrachien et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.065

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/mr/WrachienCLMDSTM14
Nicola Wrachien, Andrea Cester, Nicolò Lago, Gaudenzio Meneghesso, Riccardo D'Alpaos, Andrea Stefani, Guido Turatti, Michele Muccini:
Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states. Microelectron. Reliab. 54(9-10): 1638-1642 (2014)

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