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"Effects of constant voltage stress on p- and n-type organic thin film ..."

Nicola Wrachien et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.085

access: closed

type: Journal Article

metadata version: 2021-06-22

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  - journals/mr/WrachienCBCDMSTM13
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  - https://dblp.org/rec/journals/mr/WrachienCBCDMSTM13
Nicola Wrachien, Andrea Cester, Daniele Bari, Raffaella Capelli, Riccardo D'Alpaos, Michele Muccini, Andrea Stefani, Guido Turatti, Gaudenzio Meneghesso:
Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric. Microelectron. Reliab. 53(9-11): 1798-1803 (2013)

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