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"Investigation of hot carrier degradation in asymmetric nDeMOS transistors."

Qingxue Wang, Lanxia Sun, Andrew Yap (2008)

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DOI: 10.1016/J.MICROREL.2007.12.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Qingxue Wang, Lanxia Sun, Andrew Yap:
Investigation of hot carrier degradation in asymmetric nDeMOS transistors. Microelectron. Reliab. 48(4): 508-513 (2008)

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