"On the need for a new ESD verification methodology to improve the ..."

Benjamin Viale et al. (2016)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2016.07.076

access: closed

type: Journal Article

metadata version: 2022-03-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/VialeFCGA16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/VialeFCGA16
Benjamin Viale, Mathieu Fer, Lionel Courau, Philippe Galy, Bruno Allard:
On the need for a new ESD verification methodology to improve the reliability of ICs in advanced 28nm UTBB FD-SOI technology. Microelectron. Reliab. 64: 101-108 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.