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"Uncertainty analysis of capacitor reliability prediction due to uneven ..."

Ionut Vernica, Huai Wang, Frede Blaabjerg (2018)

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DOI: 10.1016/J.MICROREL.2018.07.059

access: closed

type: Journal Article

metadata version: 2021-05-27

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Ionut Vernica, Huai Wang, Frede Blaabjerg:
Uncertainty analysis of capacitor reliability prediction due to uneven thermal loading in photovoltaic applications. Microelectron. Reliab. 88-90: 1036-1041 (2018)

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