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"Evaluation of test methods for silicon die strength."

Ming-Yi Tsai, C. H. Chen (2008)

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DOI: 10.1016/J.MICROREL.2008.03.003

access: closed

type: Journal Article

metadata version: 2021-04-08

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Ming-Yi Tsai, C. H. Chen:
Evaluation of test methods for silicon die strength. Microelectron. Reliab. 48(6): 933-941 (2008)

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