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"A dual burn-in policy for defect-tolerant memory products using the number ..."

Seung-Hoon Tong, Bong-Jin Yum (2008)

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DOI: 10.1016/J.MICROREL.2007.03.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Seung-Hoon Tong, Bong-Jin Yum:
A dual burn-in policy for defect-tolerant memory products using the number of repairs as a quality indicator. Microelectron. Reliab. 48(3): 471-480 (2008)

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