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"Reliability of planar, Super-Junction and trench low voltage power MOSFETs."

Antonio Testa et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.042

access: closed

type: Journal Article

metadata version: 2020-10-30

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Antonio Testa, Salvatore De Caro, Saverio Panarello, Salvatore Patanè, Sebastiano Russo, D. Patti, S. Poma, Romeo Letor:
Reliability of planar, Super-Junction and trench low voltage power MOSFETs. Microelectron. Reliab. 50(9-11): 1789-1795 (2010)

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