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"Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart ..."

Augusto Tazzoli et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.020

access: closed

type: Journal Article

metadata version: 2020-02-22

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Augusto Tazzoli, Lorenzo Cerati, A. Andreini, Gaudenzio Meneghesso:
Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology. Microelectron. Reliab. 49(9-11): 1111-1115 (2009)

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