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"Radiation-induced single event transients modeling and testing on ..."

Luca Sterpone, Boyang Du, Sarah Azimi (2015)

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DOI: 10.1016/J.MICROREL.2015.07.035

access: closed

type: Journal Article

metadata version: 2021-10-14

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Luca Sterpone, Boyang Du, Sarah Azimi:
Radiation-induced single event transients modeling and testing on nanometric flash-based technologies. Microelectron. Reliab. 55(9-10): 2087-2091 (2015)

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