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"Channel width dependence of AC stress on bulk nMOSFETs."
Donghee Son et al. (2016)
- Donghee Son, Gang-Jun Kim, Ji-Hoon Seo, Nam-Hyun Lee, YongHa Kang, Bongkoo Kang:
Channel width dependence of AC stress on bulk nMOSFETs. Microelectron. Reliab. 64: 194-198 (2016)
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