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"Applications of TEM imaging, analysis and electron holography to ..."
David J. Smith et al. (2010)
- David J. Smith, David A. Cullen, Lin Zhou, Martha R. McCartney:
Applications of TEM imaging, analysis and electron holography to III-nitride HEMT devices. Microelectron. Reliab. 50(9-11): 1514-1519 (2010)
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