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"Degradation and recovery of variability due to BTI."
Christian Schlünder et al. (2016)
- Christian Schlünder, Jörg Berthold, Fabian Proebster, Andreas Martin, Wolfgang Gustin, Hans Reisinger:
Degradation and recovery of variability due to BTI. Microelectron. Reliab. 64: 179-184 (2016)
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