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"3D electro-thermal investigations for reliability of ultra low ON state ..."

Jean-Baptiste Sauveplane et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.022

access: closed

type: Journal Article

metadata version: 2022-05-06

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Jean-Baptiste Sauveplane, Patrick Tounsi, Emmanuel Scheid, A. Deram:
3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET. Microelectron. Reliab. 48(8-9): 1464-1467 (2008)

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