"On-wafer measurement of the reverse-recovery time of integrated diodes by ..."

Martin Sauter et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.02.012

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type: Journal Article

metadata version: 2020-02-22

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Martin Sauter, Werner Simbürger, David Johnsson, Matthias Stecher:
On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP). Microelectron. Reliab. 51(8): 1309-1314 (2011)

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