Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Impact of dynamic voltage scaling and thermal factors on SRAM reliability."

Felipe Rosa et al. (2015)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2015.07.013

access: closed

type: Journal Article

metadata version: 2022-10-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/RosaBWKOR15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/RosaBWKOR15
Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Fernanda Gusmão de Lima Kastensmidt, Luciano Ost, Ricardo Reis:
Impact of dynamic voltage scaling and thermal factors on SRAM reliability. Microelectron. Reliab. 55(9-10): 1486-1490 (2015)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.