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"Analysis of quantum conductance, read disturb and switching statistics in ..."

Alok Ranjan et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.112

access: closed

type: Journal Article

metadata version: 2023-03-21

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Alok Ranjan, Nagarajan Raghavan, Joel Molina Reyes, Sean J. O'Shea, Kalya Shubhakar, Kin Leong Pey:
Analysis of quantum conductance, read disturb and switching statistics in HfO₂ RRAM using conductive AFM. Microelectron. Reliab. 64: 172-178 (2016)

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