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"Hot carrier aging degradation phenomena in GaN based MESFETs."

Fabiana Rampazzo et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.017

access: closed

type: Journal Article

metadata version: 2024-05-07

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  - https://dblp.org/rec/journals/mr/RampazzoPPGTBMZ04
Fabiana Rampazzo, Roberto Pierobon, D. Pacetta, Christophe Gaquière, Didier Théron, Bertrand Boudart, Gaudenzio Meneghesso, Enrico Zanoni:
Hot carrier aging degradation phenomena in GaN based MESFETs. Microelectron. Reliab. 44(9-11): 1375-1380 (2004)

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