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"Failure Analysis of RuO₂ Thick Film Chip Resistors."

Simona Podda et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.103

access: closed

type: Journal Article

metadata version: 2021-06-01

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Simona Podda, G. Cassanelli, Fausto Fantini, Massimo Vanzi:
Failure Analysis of RuO₂ Thick Film Chip Resistors. Microelectron. Reliab. 44(9-11): 1763-1767 (2004)

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