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"Failure analysis of ESD-stressed SiC MESFET."
Tanguy Phulpin et al. (2015)
- Tanguy Phulpin, David Trémouilles
, Karine Isoird
, Dominique Tournier, Philippe Godignon
, Patrick Austin:
Failure analysis of ESD-stressed SiC MESFET. Microelectron. Reliab. 55(9-10): 1542-1548 (2015)
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