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"Off-state degradation with ac bias in PMOSFET."
Segeun Park et al. (2016)
- Segeun Park, Hyuckchai Jung, Jeonghoon Oh, Ilgweon Kim, Hyoungsun Hong, Gyoyoung Jin, Yonghan Roh:
Off-state degradation with ac bias in PMOSFET. Microelectron. Reliab. 65: 16-19 (2016)
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