Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for ..."

Mourad Oualli et al. (2018)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2018.07.142

access: closed

type: Journal Article

metadata version: 2022-05-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/OualliDPAPGLJTL18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/OualliDPAPGLJTL18
Mourad Oualli, Christian Dua, O. Patard, P. Altuntas, S. Piotrowicz, Piero Gamarra, Cedric Lacam, J.-C. Jacquet, L. Teisseire, D. Lancereau, Eric Chartier, C. Potier, Sylvain L. Delage:
Stability and robustness of InAlGaN/GaN HEMT in short-term DC tests for different passivation schemes. Microelectron. Reliab. 88-90: 418-422 (2018)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.