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"Insights on trap generation and breakdown in ultra thin SiO2 ..."
Paul E. Nicollian (2008)
- Paul E. Nicollian:
Insights on trap generation and breakdown in ultra thin SiO2 and SiON dielectrics from low voltage stress-induced leakage current measurements. Microelectron. Reliab. 48(8-9): 1171-1177 (2008)
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