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"Effect of short circuit aging on safe operating area of SiC MOSFET."
Tien Anh Nguyen, Stéphane Lefebvre, Stephane Azzopardi (2018)
- Tien Anh Nguyen, Stéphane Lefebvre, Stephane Azzopardi:
Effect of short circuit aging on safe operating area of SiC MOSFET. Microelectron. Reliab. 88-90: 645-651 (2018)
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