"RF measurements to pinpoint defects in inkjet-printed, thermally and ..."

Sami Myllymäki et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.08.021

access: closed

type: Journal Article

metadata version: 2020-02-22

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Sami Myllymäki, Jussi Putaala, Jari Hannu, Esa Kunnari, Matti Mäntysalo:
RF measurements to pinpoint defects in inkjet-printed, thermally and mechanically stressed coplanar waveguides. Microelectron. Reliab. 65: 142-150 (2016)

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