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"Multi-Poisson process analysis of real-time soft-error rate measurements ..."

Soilihi Moindjie et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.045

access: closed

type: Journal Article

metadata version: 2022-03-23

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Soilihi Moindjie, Jean-Luc Autran, Daniela Munteanu, Gilles Gasiot, Philippe Roche:
Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs. Microelectron. Reliab. 76-77: 53-57 (2017)

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