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"Reliability assessment of integrated power transistors: Lateral DMOS ..."

Peter Moens, Geert Van den Bosch (2008)

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DOI: 10.1016/J.MICROREL.2008.06.048

access: closed

type: Journal Article

metadata version: 2021-02-24

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Peter Moens, Geert Van den Bosch:
Reliability assessment of integrated power transistors: Lateral DMOS versus vertical DMOS. Microelectron. Reliab. 48(8-9): 1300-1305 (2008)

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