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"Compact modeling of the non-linear post-breakdown current in thin gate ..."

Enrique Miranda (2008)

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DOI: 10.1016/J.MICROREL.2008.06.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Enrique Miranda:
Compact modeling of the non-linear post-breakdown current in thin gate oxides using the generalized diode equation. Microelectron. Reliab. 48(8-9): 1604-1607 (2008)

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