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"Characterization of alterations on power MOSFET devices under extreme ..."

Donatien Martineau et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.065

access: closed

type: Journal Article

metadata version: 2023-03-21

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Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade:
Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. Microelectron. Reliab. 50(9-11): 1768-1772 (2010)

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