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"GaN-based HEMTs tested under high temperature storage test."

Denis Marcon et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.062

access: closed

type: Journal Article

metadata version: 2024-04-11

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  - https://dblp.org/rec/journals/mr/MarconKVHSDMB11
Denis Marcon, Xuanwu Kang, John Viaene, Marleen Van Hove, Puneet Srivastava, Stefaan Decoutere, Robert Mertens, Gustaaf Borghs:
GaN-based HEMTs tested under high temperature storage test. Microelectron. Reliab. 51(9-11): 1717-1720 (2011)

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