"Complex automotive ICs defect localization driven by quiescent power ..."

Giulia Marcello, Eleonora Meda, Matteo Medda (2018)

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DOI: 10.1016/J.MICROREL.2018.06.079

access: closed

type: Journal Article

metadata version: 2022-10-02

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Giulia Marcello, Eleonora Meda, Matteo Medda:
Complex automotive ICs defect localization driven by quiescent power supply current: Three cases study. Microelectron. Reliab. 88-90: 294-298 (2018)

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