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"Investigation of degradation mechanisms in low-voltage p-channel power ..."

Paolo Magnone, Giacomo Barletta, A. Magrì (2018)

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DOI: 10.1016/J.MICROREL.2018.06.029

access: closed

type: Journal Article

metadata version: 2020-02-22

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Paolo Magnone, Giacomo Barletta, A. Magrì:
Investigation of degradation mechanisms in low-voltage p-channel power MOSFETs under High Temperature Gate Bias stress. Microelectron. Reliab. 88-90: 438-442 (2018)

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