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"Thermal reliability of VCO using InGaP/GaAs HBTs."
Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou (2011)
- Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou:
Thermal reliability of VCO using InGaP/GaAs HBTs. Microelectron. Reliab. 51(12): 2147-2152 (2011)
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